The JEOL 2100F is a multipurpose, 200-kV Field Emission - Transmission Electron Microscope (FE-TEM). The FE electron gun (FEG) produces a highly stable and bright electron probe that cannot be achieved with a conventional thermionic electron gun. This is essential for ultra-high resolution scanning transmission microscopy and analysis of a nano-scaled samples.
The system is equipped with various analytical instruments and/or cameras, including EDS (Energy Dispersive X-ray Spectrometry), EELS (Electron Energy Loss Spectrometry), and a CCD imaging camera.