The Bruker Dimension 3100 SPM with Nanoscope V Controller is a multi-mode Scanning Probe Microscope (SPM) capable of providing 3D imaging of
both conductive and non-conductive sample surfaces at the atomic level. Our system
can achieve sub nm vertical resolution and nm lateral resolution. Maximum Scan area
is 100 渭m x 100 渭m with max vertical range of ~ 8 渭m.
System Capabilities:
- Atomic Force Microscopy (AFM) in the tapping and contact modes to measure surface topography, roughness, film thickness, feature size etc.
- Phase imaging AFM for variations in composition, adhesion, friction, viscoelasticity, differentiating regions of high and low surface adhesion/hardness; contaminant identification, mapping of components in composite materials.
- Conductive AFM for mapping of electrical conductivity across medium- to low-conducting and semiconducting materials.
- Scanning Tunneling Microscopy (STM) for topography of surface electronic states.
- Magnetic Force Microscopy (MFM) for domain structures in magnetic materials.
- Scanning Capacitance Microscopy (SCM) to map variations in electron (hole) concentration on the surface of a doped semiconductor.
- Force Modulation Microscopy (FMM) to determine relative elasticity/stiffness of surface features.
- Nano-manipulation/Nano-lithography for manipulation of nanoscale objects; anodic oxidation for fabrication of nano-patterns at localized areas.
- Nano-indentation to measure mechanical properties by nano-indentations, nano-scratching and wear testing for film adhesion and durability studies.
- Fluid cell measurement for AFM imaging of samples in a liquid environment.